Crystalline silicon solar cells currently mainly include monocrystalline silicon and polycrystalline silicon cells, which are characterized by stable performance, mature market technology, and conventional sample size of 125mm or 156mm square cells. During the development of the testing of crystalline silicon solar cells, many serious problems have emerged, such as debris, cell cracking, surface contamination, and poor electrodes. It is these defects that limit the photoelectric conversion efficiency and service life of the cell. At the same time, because there is no perfect industry standard, the test quality of crystalline silicon solar cells is also uneven. The existence of some defective sheets directly affects the stability of the components and even the photovoltaic system. Therefore, crystalline silicon solar cells need to have a fast, effective and accurate positioning inspection method to inspect the problems that may occur in the production link.
Zhuoli Hanguang Helios photoluminescence imaging test system can quickly measure the absolute minority carrier lifetime of crystalline silicon, and at the same time obtain a two-dimensional image characterizing the distribution of material defects. In the production process of solar cells, this information can be used for on-line screening of feed materials and process process monitoring, so that each process is optimized. By measuring the corrected photoluminescence image, it is possible to quantitatively measure the defect distribution and impurity content levels of the solar cell raw materials.
Wafer feed screening: Zhuoli Hanguang's Helios photoluminescence image test system tests the minority carrier life image of each wafer at the feed end of the solar cell production line to obtain an estimate of the photoelectric conversion efficiency of the output cell. According to the test data, the wafer is graded, and the corresponding optimized process is selected according to different grades.
Production process control: Zhuoli Hanguang Helios photoluminescence imaging test system is a system set to offline detection mode, which monitors each key process on the production line. By comparing the difference between the cell measurement data before and after the process, it can assist in optimizing the production line process parameters. For new production lines, process parameters need to be debugged before being put into production. The use of photoluminescence image test system can greatly shorten the debugging time and achieve rapid commissioning.
Damage inspection and detection: Zhuoli Hanguang Helios photoluminescence imaging test system can detect the damage and cracks produced by the battery during the production process.
The crystalline silicon solar cell manufacturer can achieve the goal of maximizing the efficiency of the product cell with the lowest production cost by using the Zhuoli Hanguang Helios photoluminescence imaging test system.
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